Sean Palka, an Associate at Booz Allen Hamilton, has contributed as a reviewer to the IEEE Transactions on Pattern Analysis and Machine Intelligence and has published a paper on biometrics vulnerabilities for the IEEE Conference on Biometrics: Theory, Applications and Systems. Mr. Palka has professional experience in a variety of fields, including software development, cryptography, and airspace information management. Mr. Palka currently works as a penetration tester and wargame scenario developer.
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